IEEE - Institute of Electrical and Electronics Engineers, Inc. - RFID-Enabled Warehouse Process Optimization in the TPL Industry

2010 43rd Hawaii International Conference on System Sciences (HICSS)

Author(s): Wamba, S.F. ; Chatfield, A.T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2010
Conference Location: Honolulu, Hawaii, USA, USA
Conference Date: 5 January 2010
Page(s): 1 - 10
ISBN (Electronic): 978-1-4244-5510-2
ISBN (Paper): 978-1-4244-5509-6
ISSN (Paper): 1530-1605
DOI: 10.1109/HICSS.2010.321
Regular:

Using the value chain model and a longitudinal real-world case study of a third-party logistics (TPL) supply chain, this study provides support for the enabling role of RFID technology in... View More

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