IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measuring Similarity for Security Vulnerabilities

2010 43rd Hawaii International Conference on System Sciences (HICSS)

Author(s): Ju An Wang ; Linfeng Zhou ; Minzhe Guo ; Hao Wang ; Camargo, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2010
Conference Location: Honolulu, Hawaii, USA, USA
Conference Date: 5 January 2010
Page(s): 1 - 10
ISBN (Electronic): 978-1-4244-5510-2
ISBN (Paper): 978-1-4244-5509-6
ISSN (Paper): 1530-1605
DOI: 10.1109/HICSS.2010.269
Regular:

As the number of software vulnerabilities increases year by year, software vulnerability becomes a focusing point in information security. This paper proposes a vulnerability similarity... View More

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