IEEE - Institute of Electrical and Electronics Engineers, Inc. - Learning Service Experience from the Service Encounter of a Retailing Chain Storefront

2010 43rd Hawaii International Conference on System Sciences (HICSS)

Author(s): Fu-Ren Lin ; Rung-Wei Po ; Orellan, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2010
Conference Location: Honolulu, Hawaii, USA, USA
Conference Date: 5 January 2010
Page(s): 1 - 10
ISBN (Electronic): 978-1-4244-5510-2
ISBN (Paper): 978-1-4244-5509-6
ISSN (Paper): 1530-1605
DOI: 10.1109/HICSS.2010.252
Regular:

In this explorative research, we seek to find the most important service experience variables determining the customer purchase decision and the clerks' influence on customers' purchase. This... View More

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