IEEE - Institute of Electrical and Electronics Engineers, Inc. - Calculating the effective pattern rate for high-speed board test applications

Author(s): J.J. Arena
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 1989
Volume: 36
Page Count: 11
Page(s): 164 - 174
ISSN (Paper): 0278-0046
ISSN (Online): 1557-9948
DOI: 10.1109/41.19065
Regular:

A complex interplay of tester specifications can force in-circuit and functional board test systems to operate at less than their specified maximum pattern rates in real-world test applications.... View More

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