IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing of memristor ratioed logic (MRL) XOR gate

2016 28th International Conference on Microelectronics (ICM)

Author(s): A. S. Emara ; A. H. Madian ; H. H. Amer ; S. H. Amer ; M. B. Abdelhalim
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Giza, Egypt
Conference Date: 17 December 2016
Page(s): 181 - 184
ISBN (Electronic): 978-1-5090-5721-4
DOI: 10.1109/ICM.2016.7847939
Regular:

This paper focuses on the production testing of Memristor Ratioed Logic (MRL) XOR gate. MRL is a family that uses memristors along with CMOS inverters to design logic gates. The two-input MRL XOR... View More

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