IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel assertion-based CAD tool for automatic extraction of functional coverage

2016 28th International Conference on Microelectronics (ICM)

Author(s): Abdelrahman G. Abubakr ; Hatem El-Kharashy ; Ahmed El-Yamany ; Sameh El-Ashry ; Khaled Salah
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Giza, Egypt
Conference Date: 17 December 2016
Page(s): 29 - 32
ISBN (Electronic): 978-1-5090-5721-4
DOI: 10.1109/ICM.2016.7847899
Regular:

Over the past decade, the increasing hardware design complexity uncovered the necessity for a justified and complete functional verification process. The implementation of a fast and reliable... View More

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