IEEE - Institute of Electrical and Electronics Engineers, Inc. - Regression modeling for subset selection in rare-event statistical circuit simulation

2016 11th International Design & Test Symposium (IDT)

Author(s): Reem El-Adawi ; Mohamed Dessouky
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Hammamet, Tunisia
Conference Date: 18 December 2016
Page(s): 205 - 209
ISBN (Electronic): 978-1-5090-4900-4
ISBN (USB): 978-1-5090-4899-1
ISSN (Electronic): 2162-061X
DOI: 10.1109/IDT.2016.7843041
Regular:

Yield estimation for high replication circuits such as SRAMs and flip flops is becoming a challenging task because a rare event in a circuit cell may impact significantly the whole system yield.... View More

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