IEEE - Institute of Electrical and Electronics Engineers, Inc. - On-line detection and diagnosis of stuck-at faults in channels of NoC-based systems

2016 IEEE International Conference on Systems, Man and Cybernetics (SMC)

Author(s): Biswajit Bhowmik ; Jatindra Kumar Deka ; Santosh Biswas ; Bhargab B. Bhattacharya
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Budapest, Hungary
Conference Date: 9 October 2016
Page(s): 4,567 - 4,572
ISBN (Electronic): 978-1-5090-1897-0
ISBN (USB): 978-1-5090-1819-2
DOI: 10.1109/SMC.2016.7844951
Regular:

This paper presents a distributed on-line test mechanism that detects stuck-at faults (SAFs) in the channels as well as identifies the faulty channel-wires in an on-chip network (NoC). The... View More

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