IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fast parameter extraction for transmission lines with arbitrarily-shaped conductors and dielectrics using the contour integral method

2016 IEEE 25th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

Author(s): Utkarsh R. Patel ; Sean V. Hum ; Piero Triverio
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: San Diego, CA, USA
Conference Date: 23 October 2016
Page(s): 193 - 196
ISBN (Electronic): 978-1-5090-6110-5
ISBN (USB): 978-1-5090-2273-1
ISSN (Electronic): 2165-4115
DOI: 10.1109/EPEPS.2016.7835448
Regular:

This paper presents an accurate surface formulation based on the contour integral method and the Dirichlet-to-Neumann operator to calculate the impedance and admittance parameters of... View More

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