IEEE - Institute of Electrical and Electronics Engineers, Inc. - Radiation compatible ports and loads for the PEEC method

2016 IEEE 25th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

Author(s): Ying S. Cao ; Li Jun Jiang ; Albert E. Ruehli ; Jun Fan ; James L. Drewniak
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: San Diego, CA, USA
Conference Date: 23 October 2016
Page(s): 107 - 110
ISBN (Electronic): 978-1-5090-6110-5
ISBN (USB): 978-1-5090-2273-1
ISSN (Electronic): 2165-4115
DOI: 10.1109/EPEPS.2016.7835429
Regular:

The partial element equivalent circuit method (PEEC) has been popularly used for signal integrity and power integrity. Its port setup usually only includes conductive effects in the format of... View More

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