IEEE - Institute of Electrical and Electronics Engineers, Inc. - Geometric variability impact on 7nm Trigate combinational cells

2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS)

Author(s): Alexandra L. Zimpeck ; Ygor Aguiar ; Cristina Meinhardt ; Ricardo Reis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Monte Carlo, Monaco
Conference Date: 11 December 2016
Page(s): 9 - 12
ISBN (Electronic): 978-1-5090-6113-6
ISBN (USB): 978-1-5090-6112-9
DOI: 10.1109/ICECS.2016.7841119
Regular:

Multigate devices are the main candidates to replace planar devices in the sub 10nm technologies. Besides all advantages, unfortunately, these processes bring additional variability sources due to... View More

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