IEEE - Institute of Electrical and Electronics Engineers, Inc. - Device nonideality effects on image reconstruction using memristor arrays

2016 IEEE International Electron Devices Meeting (IEDM)

Author(s): Wen Ma ; Fuxi Cai ; Chao Du ; Yeonjoo Jeong ; Mohammed Zidan ; Wei D. Lu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: San Francisco, CA, USA
Conference Date: 3 December 2016
ISBN (Electronic): 978-1-5090-3902-9
ISBN (USB): 978-1-5090-3901-2
ISSN (Electronic): 2156-017X
DOI: 10.1109/IEDM.2016.7838434
Regular:

We analyze the effects of device variability during experimental image reconstruction using memristor crossbar arrays. The effects of device variability during online and offline training were... View More

Advertisement