IEEE - Institute of Electrical and Electronics Engineers, Inc. - Blind Image Quality Assessment via Convolutional Neural Network

2016 9th International Symposium on Computational Intelligence and Design (ISCID)

Author(s): Meiyin Wu ; Li Chen
Sponsor(s): IEEE Nanjing Comput. Intell. Chapter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Hangzhou, China
Conference Date: 10 December 2016
Volume: 1
Page(s): 221 - 224
ISBN (Electronic): 978-1-5090-3558-8
ISSN (Electronic): 2473-3547
DOI: 10.1109/ISCID.2016.1057
Regular:

This paper proposed a novel blind image quality assessment method that is created by training a convolutional neural network to learn discriminant features of image quality and fitting the... View More

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