IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design for Hardware In-the-Loop Real-Time Simulation Test of Combined Seeker

2016 9th International Symposium on Computational Intelligence and Design (ISCID)

Author(s): Yang Zhang ; Chuan Shi ; Huanyao Dai
Sponsor(s): IEEE Nanjing Comput. Intell. Chapter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Hangzhou, China
Conference Date: 10 December 2016
Volume: 1
Page(s): 74 - 77
ISBN (Electronic): 978-1-5090-3558-8
ISSN (Electronic): 2473-3547
DOI: 10.1109/ISCID.2016.1025
Regular:

Hardware in-the-loop simulation test has the advantage of live test, digital simulation test, which can build the lifelike test environment. This kind of test can carry through repeated test of... View More

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