IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optimal accuracy improvement method in throughput estimation of manufacturing flow line

2016 14th International Conference on Control, Automation, Robotics and Vision (ICARCV)

Author(s): Heqing Sun ; Hao Gu ; Zehao Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2016
Conference Location: Phuket, Thailand
Conference Date: 13 November 2016
Page(s): 1 - 5
ISBN (Electronic): 978-1-5090-3549-6
ISBN (USB): 978-1-5090-4757-4
DOI: 10.1109/ICARCV.2016.7838621
Regular:

In the mass production environment, manufacturing flow lines are the most commonly used method. During the design phase of the manufacturing flow line, it is necessary to estimate the throughput... View More

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