IEEE - Institute of Electrical and Electronics Engineers, Inc. - Nanomanipulator based on a high-speed atomic force microscope capable of controlling a cantilever loading force using a magnetic solenoid

2016 International Symposium on Micro-NanoMechatronics and Human Science (MHS)

Author(s): Kohei Iwasaki ; Yuki Takeda ; Futoshi Iwata
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2016
Conference Location: Nagoya, Japan
Conference Date: 28 November 2016
Page(s): 1 - 5
ISBN (Electronic): 978-1-5090-2785-9
ISSN (Electronic): 2474-3771
DOI: 10.1109/MHS.2016.7824205
Regular:

In this paper, we describe a real-time manipulation system based on a high-speed atomic force microscope (HS-AFM) in various environments such as air and liquid. Using the system, AFM images of... View More

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