IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault propagation analysis of IGBT fault in CRH5 traction system based on signed directed graph

2016 Prognostics and System Health Management Conference (PHM-Chengdu)

Author(s): Xi Xu ; Ningyun Lu ; Jiaqi Yong ; Bin Jiang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Chengdu, China
Conference Date: 19 October 2016
Page(s): 1 - 6
ISBN (Electronic): 978-1-5090-2778-1
ISBN (USB): 978-1-5090-2777-4
ISSN (Electronic): 2166-5656
DOI: 10.1109/PHM.2016.7819949
Regular:

This paper proposes a method using SDG (Signed Directed Graph) to investigate fault propagation mechanism of IGBT faults in traction system of CRH (China Railway High-speed) trains. A TCG (Time... View More

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