IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic test pattern generation method of flash memory based on Labview

2016 Prognostics and System Health Management Conference (PHM-Chengdu)

Author(s): Cheng Gao ; Linjiang Hu ; Jiaoying Huang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Chengdu, China
Conference Date: 19 October 2016
Page(s): 1 - 5
ISBN (Electronic): 978-1-5090-2778-1
ISBN (USB): 978-1-5090-2777-4
ISSN (Electronic): 2166-5656
DOI: 10.1109/PHM.2016.7819943
Regular:

Flash memory is widely used in many fields, but there are still some problems with the generation of test pattern. The working and testing method of the memory is complex, for large capacity... View More

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