IEEE - Institute of Electrical and Electronics Engineers, Inc. - Degradation analysis of 830nm laser diodes based on PSpice model

2016 Prognostics and System Health Management Conference (PHM-Chengdu)

Author(s): Guishan Wang ; Jing Qiu ; Peng Yang ; Guanjun Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Chengdu, China
Conference Date: 19 October 2016
Page(s): 1 - 6
ISBN (Electronic): 978-1-5090-2778-1
ISBN (USB): 978-1-5090-2777-4
ISSN (Electronic): 2166-5656
DOI: 10.1109/PHM.2016.7819930
Regular:

Researches on the degradation mechanisms of Laser diode (LD) widely used in the fields of laser communication, medicine and military affairs remain to be complex and difficult. Distincting from... View More

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