IEEE - Institute of Electrical and Electronics Engineers, Inc. - An improved remaining useful life prediction method for system with volatile degradation path

2016 Prognostics and System Health Management Conference (PHM-Chengdu)

Author(s): Dangbo Du ; Changhua Hu ; Xiaosheng Si ; Zhengxin Zhang ; Wei Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Chengdu, China
Conference Date: 19 October 2016
Page(s): 1 - 5
ISBN (Electronic): 978-1-5090-2778-1
ISBN (USB): 978-1-5090-2777-4
ISSN (Electronic): 2166-5656
DOI: 10.1109/PHM.2016.7819817
Regular:

Remaining useful life (RUL) prediction is a key link in prognostics and health management. More accurate RUL prediction results will lead to more reasonable decision making on sequential... View More

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