IEEE - Institute of Electrical and Electronics Engineers, Inc. - A temperature sensor failure diagnosis approach in frequency

2016 Prognostics and System Health Management Conference (PHM-Chengdu)

Author(s): Xiaojia Han ; Jin Jiang ; Aidong Xu ; Bingjun Yan ; Chao Pei
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Chengdu, China
Conference Date: 19 October 2016
Page(s): 1 - 4
ISBN (Electronic): 978-1-5090-2778-1
ISBN (USB): 978-1-5090-2777-4
ISSN (Electronic): 2166-5656
DOI: 10.1109/PHM.2016.7819789
Regular:

This paper introduces an on-line diagnostic function for temperature sensors using a noise analysis approach. The deviation of temperature measurements from their average value is treated as the... View More

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