IEEE - Institute of Electrical and Electronics Engineers, Inc. - Big data oriented root cause identification approach based on PCA and SVM for product infant failure

2016 Prognostics and System Health Management Conference (PHM-Chengdu)

Author(s): Zhenzhen He ; Yihai He ; Yi Wei
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Chengdu, China
Conference Date: 19 October 2016
Page(s): 1 - 5
ISBN (Electronic): 978-1-5090-2778-1
ISBN (USB): 978-1-5090-2777-4
ISSN (Electronic): 2166-5656
DOI: 10.1109/PHM.2016.7819776
Regular:

Due to the increasing complexity and huge number of uncontrolled operational factors in manufacturing, the produced product usually comes with an exceptional high infant failure rate, and the root... View More

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