IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improve the Quality of ARC Systems Based on the Metamorphic Testing

2016 International Symposium on System and Software Reliability (ISSSR)

Author(s): Jihu Zhang ; Xiaochuan Jing ; Wei Zhang ; Haipeng Wang ; Yunwei Dong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Shanghai, China
Conference Date: 29 October 2016
Page(s): 137 - 141
ISBN (Electronic): 978-1-5090-5563-0
DOI: 10.1109/ISSSR.2016.029
Regular:

In order to improve the quality of Activity Recognition Chain (ARC) systems, an effective testing approach is required to evaluate the functionalities of their major components, especially for two... View More

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