IEEE - Institute of Electrical and Electronics Engineers, Inc. - In-pixel A/D converters with 120-dB dynamic range using event-driven correlated double sampling for stacked SOI image sensors

2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)

Author(s): Masahide Goto ; Yuki Honda ; Toshihisa Watabe ; Kei Hagiwara ; Masakazu Nanba ; Yoshinori Iguch ; Takuya Saraya ; Masaharu Kobayashi ; Eiji Higurashi ; Hiroshi Toshiyoshi ; Toshiro Hiramoto
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Burlingame, CA, USA
Conference Date: 10 October 2016
Page(s): 1 - 3
ISBN (Electronic): 978-1-5090-4391-0
DOI: 10.1109/S3S.2016.7804399
Regular:

We report in-pixel analog-to-digital converters (ADCs) using event-driven correlated double sampling (CDS) for stacked silicon-on-insulator (SOI) image sensors. The pulse-frequency-moduView More

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