IEEE - Institute of Electrical and Electronics Engineers, Inc. - Spatial and spectral features utilization on a Hyperspectral imaging system for rice seed varietal purity inspection

2016 IEEE International Conference on Computing & Communication Technologies: Research, Innovation and Vision for the Future (RIVF)

Author(s): Hai Vu ; Christos Tachtatzis ; Paul Murray ; David Harle ; Trung Kien Dao ; Thi-Lan Le ; Ivan Andonovic ; Stephen Marshall
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2016
Conference Location: Hanoi, Vietnam
Conference Date: 7 November 2016
Page(s): 169 - 174
ISBN (Electronic): 978-1-5090-4134-3
ISBN (Paper): 978-1-5090-4133-6
DOI: 10.1109/RIVF.2016.7800289
Regular:

A conventional method to inspect the varietal purity of rice seeds is based on human visual inspection where a random sample is drawn from a batch. This is a tedious, laborious, time consuming and... View More

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