IEEE - Institute of Electrical and Electronics Engineers, Inc. - Semantic text alignment based on topic modeling

2016 IEEE International Conference on Computing & Communication Technologies: Research, Innovation and Vision for the Future (RIVF)

Author(s): Huong T. Le ; Lam N. Pham ; Duy D. Nguyen ; Son V. Nguyen ; An N. Nguyen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2016
Conference Location: Hanoi, Vietnam
Conference Date: 7 November 2016
Page(s): 67 - 72
ISBN (Electronic): 978-1-5090-4134-3
ISBN (Paper): 978-1-5090-4133-6
DOI: 10.1109/RIVF.2016.7800271
Regular:

The development of Internet makes plagiarism problem more and more serious. Plagiarism can be in different types, ranging from copying texts to adopting ideas, without giving credit to the... View More

Advertisement