IEEE - Institute of Electrical and Electronics Engineers, Inc. - A study on the control charts based on quality loss function

2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Suyi Li ; Wenjia Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Bali, Indonesia
Conference Date: 4 December 2016
Page(s): 1,933 - 1,937
ISBN (Electronic): 978-1-5090-3665-3
ISBN (USB): 978-1-5090-3664-6
ISSN (Electronic): 2157-362X
DOI: 10.1109/IEEM.2016.7798215
Regular:

Loss functions have been well studied for decades. Some researchers use loss function to design control charts economically, but few have used loss function to construct control charts directly.... View More

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