IEEE - Institute of Electrical and Electronics Engineers, Inc. - Critical issues of applying machine learning to condition monitoring for failure diagnosis

2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): F. Q. Yuan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Bali, Indonesia
Conference Date: 4 December 2016
Page(s): 1,903 - 1,907
ISBN (Electronic): 978-1-5090-3665-3
ISBN (USB): 978-1-5090-3664-6
ISSN (Electronic): 2157-362X
DOI: 10.1109/IEEM.2016.7798209
Regular:

Machine learning is a hot topic recently. For condition monitoring, the machine learning is mainly used to improve the failure diagnosis accuracy, as the machine learning can provide flexible... View More

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