IEEE - Institute of Electrical and Electronics Engineers, Inc. - Equipment assessment methodology and automatic management system in automotive semiconductor manufacturing

2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Ziqian Javaer Liu ; Hongtao H. T. Qian ; Yuhong Betsy Xu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Bali, Indonesia
Conference Date: 4 December 2016
Page(s): 1,584 - 1,587
ISBN (Electronic): 978-1-5090-3665-3
ISBN (USB): 978-1-5090-3664-6
ISSN (Electronic): 2157-362X
DOI: 10.1109/IEEM.2016.7798144
Regular:

With the speedy developing of automotive market, the demand of automotive electronics semiconductor becomes more tremendous. Traditional semi-automatical equipment management method became... View More

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