IEEE - Institute of Electrical and Electronics Engineers, Inc. - The reliability analysis of repairable k-out-of-n systems with component lifetimes and repair time subjected to phase-type distribution

2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Wei Wang ; Tong Chen ; Di Peng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Bali, Indonesia
Conference Date: 4 December 2016
Page(s): 1,426 - 1,430
ISBN (Electronic): 978-1-5090-3665-3
ISBN (USB): 978-1-5090-3664-6
ISSN (Electronic): 2157-362X
DOI: 10.1109/IEEM.2016.7798113
Regular:

This research investigates a k-out-of-n system in which the lifetime of operational and standby components, the repair time follow continuous phase-type (PH) distribution, instead of exponential... View More

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