IEEE - Institute of Electrical and Electronics Engineers, Inc. - Nonparametric information criterion for change point problems

2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Asokan Mulayath Variyath ; Chithran Vadaverkkot Vasudevan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Bali, Indonesia
Conference Date: 4 December 2016
Page(s): 1,417 - 1,421
ISBN (Electronic): 978-1-5090-3665-3
ISBN (USB): 978-1-5090-3664-6
ISSN (Electronic): 2157-362X
DOI: 10.1109/IEEM.2016.7798111
Regular:

The identification of change points is often considered as a model selection problem and the most commonly used methods are the Akaike information criterion (AIC), Bayesian information criterion... View More

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