IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability analysis of dynamic reliability blocks through conversion into dynamic bayesian networks

2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Kanjing Li ; Ren Yi ; Zheng Ma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Bali, Indonesia
Conference Date: 4 December 2016
Page(s): 1,330 - 1,334
ISBN (Electronic): 978-1-5090-3665-3
ISBN (USB): 978-1-5090-3664-6
ISSN (Electronic): 2157-362X
DOI: 10.1109/IEEM.2016.7798094
Regular:

Recently, the dynamic Reliability Block Diagram (DRBD) with the characteristics of intuitiveness and visibility has been extensively employed in industrial fields, such as aerospace, military... View More

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