IEEE - Institute of Electrical and Electronics Engineers, Inc. - Acceptance sampling plans based on truncated life test for the generalized Weibull model

2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Shovan Chowdhury
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Bali, Indonesia
Conference Date: 4 December 2016
Page(s): 886 - 889
ISBN (Electronic): 978-1-5090-3665-3
ISBN (USB): 978-1-5090-3664-6
ISSN (Electronic): 2157-362X
DOI: 10.1109/IEEM.2016.7798004
Regular:

In this paper, we develop acceptance sampling plan (ASP) when the lifetime experiment is truncated at a pre-assigned time. The minimum sample size required to ensure a specified median life of the... View More

Advertisement