IEEE - Institute of Electrical and Electronics Engineers, Inc. - Investigating the necessity of acceleration in a degradation test

2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Lanqing Hong ; Zhisheng Ye ; Xingqiu Zhao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Bali, Indonesia
Conference Date: 4 December 2016
Page(s): 546 - 550
ISBN (Electronic): 978-1-5090-3665-3
ISBN (USB): 978-1-5090-3664-6
ISSN (Electronic): 2157-362X
DOI: 10.1109/IEEM.2016.7797935
Regular:

When using acceleration in a degradation test, additional parameters are needed to incorporate the accelerating variables into the degradation process, requiring more statistical information to... View More

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