IEEE - Institute of Electrical and Electronics Engineers, Inc. - A prediction model of hard landing based on RBF neural network with K-means clustering algorithm

2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

Author(s): Xiaoduo Qiao ; Wenbing Chang ; Shenghan Zhou ; Xuefeng Lu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Bali, Indonesia
Conference Date: 4 December 2016
Page(s): 462 - 465
ISBN (Electronic): 978-1-5090-3665-3
ISBN (USB): 978-1-5090-3664-6
ISSN (Electronic): 2157-362X
DOI: 10.1109/IEEM.2016.7797918
Regular:

This paper proposes a prediction model for forecasting the hard landing problem. The landing phase has been demonstrated the most dangerous phase in flight cycle for fatal accidents. The landing... View More

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