IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust cutting-edge detection based on intensity concentration

2016 IEEE International Conference on Consumer Electronics - Asia (ICCE-Asia)

Author(s): Wei Li ; Cheng-Bin Jin ; Mingjie Ma ; Jong-Hee Kim ; Hakil Kim ; Xuenan Cui
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Seoul, South Korea
Conference Date: 26 October 2016
Page(s): 1 - 4
ISBN (Electronic): 978-1-5090-2743-9
DOI: 10.1109/ICCE-Asia.2016.7804823
Regular:

This paper proposes three robust detection algorithms for locating the cutting line in an image captured by a panel-cutting system. All of the proposed methods contain two stages: edge detection... View More

Advertisement