IEEE - Institute of Electrical and Electronics Engineers, Inc. - An on-chip jitter tolerance test circuit for mobile and video interfaces

2016 IEEE International Conference on Consumer Electronics - Asia (ICCE-Asia)

Author(s): Ik-Hwan Kim ; Jae-Hong Jung ; Sang-Hoon Kim ; Jung-Hoon Chun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2016
Conference Location: Seoul, South Korea
Conference Date: 26 October 2016
Page(s): 1 - 4
ISBN (Electronic): 978-1-5090-2743-9
DOI: 10.1109/ICCE-Asia.2016.7804761
Regular:

We proposed an on-chip jitter injection circuit embedded in phase-locked-loop for jitter tolerance test of clock and data recovery circuit. The proposed jitter modulation block consists of... View More

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