IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliable particle-swarm-optimization based parameter extraction method applied to GaN HEMTs

2016 16th Mediterranean Microwave Symposium (MMS)

Author(s): Ahmed S. Hussein ; Anwar H. Jarndal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2016
Conference Location: Abu Dhabi, United Arab Emirates
Conference Date: 14 November 2016
Page(s): 1 - 4
ISBN (Electronic): 978-1-5090-2586-2
ISBN (USB): 978-1-5090-2585-5
ISSN (Electronic): 2157-9830
DOI: 10.1109/MMS.2016.7803850
Regular:

This paper presents an efficient parameter extraction method applied to GaN high electron mobility transistors (HEMTs) for mm-wave applications. The procedure is based on S-parameters measurements... View More

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