IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fringe visibility analysis on silica glass based on automated Michelson interferometry system

2016 3rd International Conference on Electronic Design (ICED)

Author(s): C. K. Lim ; W. M. W. Norhaimi ; Z. Sauli ; V. Retnasamy ; M. H. A. Aziz ; S. Taniselass ; A. S. A. Bakhit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2016
Conference Location: Phuket, Thailand
Conference Date: 11 August 2016
Page(s): 240 - 245
ISBN (Electronic): 978-1-5090-2160-4
ISBN (USB): 978-1-5090-2159-8
DOI: 10.1109/ICED.2016.7804645
Regular:

A non-contact measurement method based on fringes produced from Michelson interferometry for fringe visibility analysis of transparent silica (SiO2) glass has been developed. An automatic... View More

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