IEEE - Institute of Electrical and Electronics Engineers, Inc. - Machine vision for laser defect in PV solar modules

2016 3rd International Conference on Electronic Design (ICED)

Author(s): R. Shuaimi ; R. C. Ismail ; M. N. M. Isa ; S. A. Z. Murad
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2016
Conference Location: Phuket, Thailand
Conference Date: 11 August 2016
Page(s): 113 - 116
ISBN (Electronic): 978-1-5090-2160-4
ISBN (USB): 978-1-5090-2159-8
DOI: 10.1109/ICED.2016.7804618
Regular:

This paper presents a new methodology in inspection on laser scribe defect of PV thin film solar modules. The work focuses on the application of machine vision as an inspection tools which has... View More

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