IEEE - Institute of Electrical and Electronics Engineers, Inc. - Metric invariance entropy and relatively invariant control sets

2016 IEEE 55th Conference on Decision and Control (CDC)

Author(s): Fritz Colonius
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 12 December 2016
Page(s): 7,341 - 7,346
ISBN (Electronic): 978-1-5090-1837-6
ISBN (DVD): 978-1-5090-1844-4
DOI: 10.1109/CDC.2016.7799403
Regular:

For control systems in discrete time, this paper considers metric (i.e., measure-theoretic) invariance entropy for a subset Q of the state space with respect to a conditionally invariant measure.... View More

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