IEEE - Institute of Electrical and Electronics Engineers, Inc. - A compressive sensing-based pixel sharing algorithm for high-speed atomic force microscopy

2016 IEEE 55th Conference on Decision and Control (CDC)

Author(s): Yufan Luo ; Sean B. Andersson
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 12 December 2016
Page(s): 2,834 - 2,839
ISBN (Electronic): 978-1-5090-1837-6
ISBN (DVD): 978-1-5090-1844-4
DOI: 10.1109/CDC.2016.7798691
Regular:

Undersampling is a simple but efficient way to increase the imaging rate of atomic force microscopy (AFM). The undersampled AFM images typically can be faithfully reconstructed with signal... View More

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