IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robustness margin for piecewise affine explicit control law

2016 IEEE 55th Conference on Decision and Control (CDC)

Author(s): Rajesh Koduri ; Pedro Rodriguez-Ayerbe ; Sorin Olaru
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 12 December 2016
Page(s): 2,327 - 2,332
ISBN (Electronic): 978-1-5090-1837-6
ISBN (DVD): 978-1-5090-1844-4
DOI: 10.1109/CDC.2016.7798610
Regular:

Classical robustness margin i.e., gain margin and phase margin, considers the gain variation and phase variation of the model for which the stability of the closed loop is preserved. In this... View More

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