IEEE - Institute of Electrical and Electronics Engineers, Inc. - A decentralized fault-tolerant control scheme based on Active Fault Diagnosis

2016 IEEE 55th Conference on Decision and Control (CDC)

Author(s): Davide M. Raimondo ; Francesca Boem ; Alexander Gallo ; Thomas Parisini
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 12 December 2016
Page(s): 2,164 - 2,169
ISBN (Electronic): 978-1-5090-1837-6
ISBN (DVD): 978-1-5090-1844-4
DOI: 10.1109/CDC.2016.7798584
Regular:

This paper deals with a decentralized fault-tolerant control methodology based on an Active Fault Diagnosis approach. The proposed technique addresses the important problem of monitoring... View More

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