IEEE - Institute of Electrical and Electronics Engineers, Inc. - Further analysis on graph rigidity

2016 IEEE 55th Conference on Decision and Control (CDC)

Author(s): Minh Hoang Trinh ; Myoung-Chul Park ; Zhiyong Sun ; Brian D. O. Anderson ; Viet Hoang Pham ; Hyo-Sung Ahn
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2016
Conference Location: Las Vegas, NV, USA
Conference Date: 12 December 2016
Page(s): 922 - 927
ISBN (Electronic): 978-1-5090-1837-6
ISBN (DVD): 978-1-5090-1844-4
DOI: 10.1109/CDC.2016.7798385
Regular:

This paper presents novel results on the symmetric rigidity matrix. Based on these results, new concepts in rigidity theory are proposed, including the worst-case, and imbalance rigidity indices... View More

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