IEEE - Institute of Electrical and Electronics Engineers, Inc. - Treatment of catastrophic events in availability assessment

Author(s): T. Aven ; H.J. Grundt
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 1989
Volume: 38
Page Count: 2
Page(s): 506 - 507
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/24.46473
Regular:

The authors discuss how catastrophic events, viz. rare failure events that violently affect the system, should be treated when assessing availability. In a general statistical framework, the... View More

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