IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of shunt over range measurement errors based on finite element method

2016 10th International Conference on Sensing Technology (ICST)

Author(s): Rundong Han ; Tianzheng Wang ; Qi Wang ; Yaxuan Zheng ; Like Dong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2016
Conference Location: Nanjing, China
Conference Date: 11 November 2016
Page(s): 1 - 5
ISBN (Electronic): 978-1-5090-0796-7
ISSN (Electronic): 2156-8073
DOI: 10.1109/ICSensT.2016.7796282
Regular:

In this paper, the thermoelectric coupling finite element model of 150A/75mV shunt and 1000A/75mV shunt were established, and the temperature rises of them when the measuring current was over... View More

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