IEEE - Institute of Electrical and Electronics Engineers, Inc. - Punch-through currents and floating strip potentials in silicon detectors

Author(s): J. Ellison ; G. Hall ; S. Roe ; R. Wheadon ; B.S. Avset ; L. Evensen
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 1989
Volume: 36
Page Count: 3
Page(s): 267 - 271
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/23.34447
Regular:

Punch-through currents flowing between adjacent p/sup +/ strips on the surface of silicon microstrip drift detectors have been observed. Measurements of the floating strip potential have shown... View More

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