IEEE - Institute of Electrical and Electronics Engineers, Inc. - Line profile of built-in field distribution of lithium drifted silicon detectors observed by using SEM

Author(s): E. Watanabe ; M. Taira ; M. Kuwata ; T. Ikeda ; K. Husimi ; S. Ohkawa
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 1989
Volume: 36
Page Count: 4
Page(s): 177 - 180
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/23.34429
Regular:

The microstructure of the built-in-field distribution of a lithium-drifted silicon detector was investigated using a scanning electron microscope (SEM). It was found that lithium ions diffuse into... View More

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