IEEE - Institute of Electrical and Electronics Engineers, Inc. - Laser simulation of single-event upset in a p-well CMOS counter

Author(s): J.A. Mazer ; K. Kang ; S. Buchner
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 1989
Volume: 36
Page Count: 3
Page(s): 1,330 - 1,332
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.1989.574133
Regular:

A laser illumination method was used to simulate single-event upset (SEU) in a p-well complementary metal-oxide-semiconductor (CMOS) logic circuit. It was found that, unlike the case of the... View More

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